Aberration-Corrected Analytical Electron Microscopy

Name: Aberration-Corrected Analytical Electron Microscopy
Brand: John Wiley & Sons Inc
SKU: 9780470518519
Price: 1531 CZK
Availability: InStock

Autor: Rik Brydson

Jazyk:

Vazba: Pevná

Vydavatel: John Wiley & Sons Inc

Dostupnost: Skladem u dodavatele

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The book is concerned with the theory, background, and practical use of transmission electron micros...

Informace o knize

Autor

Rik Brydson

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2011

Stránek

296

EAN

9780470518519

ISBN

0470518510

Enbook ID

01388456

Vydavatel

John Wiley & Sons Inc

Hmotnost

580

Rozměry

164 x 240 x 20

Kompletní popis

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

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Aberration-Corrected Analytical Electron Microscopy

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Kompletní popis

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