Kniha Advanced Materials Characterization M. Muralidhar Singh

Advanced Materials Characterization

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 14-21 dnů
1 570
The book covers various methods of characterization of advanced materials commonly used in engineeri...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2024
Stránek
130
EAN
9781032375113
ISBN
1032375116
Enbook ID
46681024
Hmotnost
238
Rozměry
156 x 234

Kompletní popis

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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