Advanced Test Methods for SRAMs

Name: Advanced Test Methods for SRAMs
Brand: Springer-Verlag New York Inc.
SKU: 9781441909374
Price: 2567 CZK
Availability: InStock

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Autor: Patrick Girard, Alberto Bosio, Luigi Dilillo

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele v malém množství

Odesíláme za 13-18 dnů

2 567 Kč

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing...

Informace o knize

Autor

Patrick Girard, Alberto Bosio, Luigi Dilillo

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2009

Stránek

171

EAN

9781441909374

ISBN

1441909370

Enbook ID

01420517

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

980

Rozměry

155 x 235 x 23

Kompletní popis

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

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Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také