Kniha Advances in Imaging and Electron Physics Peter W. Hawkes

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Jazyk: Angličtina
Vazba: Pevná
Dostupnost: U nakladatele na objednávku
Odesíláme za 28-34 dnů
4 881
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronic...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2010
Stránek
304
EAN
9780123813183
ISBN
0123813182
Enbook ID
04494502
Hmotnost
540
Rozměry
152 x 229 x 20

Kompletní popis

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. It features contributions from leading international scholars and industry experts. It discusses hot topic areas and presents current and future research trends. It is an invaluable reference and guide for physicists, engineers and mathematicians.

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