Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer-Verlag New York Inc.
SKU: 9781461294993
Price: 1147 CZK
Availability: InStock

Volume 28

Autor: Charles S. Barrett, Paul K. Predecki

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele

Odesíláme za 5-8 dnů

1 147 Kč

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984....

Informace o knize

Autor

Charles S. Barrett, Paul K. Predecki

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2011

Stránek

408

EAN

9781461294993

ISBN

1461294991

Enbook ID

02174633

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

780

Rozměry

178 x 254 x 23

Kompletní popis

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Advances in X-Ray Analysis

Volume 28

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také