Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer-Verlag New York Inc.
SKU: 9781468476088
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Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961

Autor: William M. Mueller

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele

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The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analy...

Informace o knize

Autor

William M. Mueller

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2012

Stránek

564

EAN

9781468476088

ISBN

1468476084

Enbook ID

05181878

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

1090

Rozměry

178 x 254 x 32

Kompletní popis

The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.

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Advances in X-Ray Analysis

Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také