AI, Machine Learning and Deep Learning
A Security Perspective
Autor:
Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA), Hei, Xiali (University of Louisiana at Lafayette, USA)
Dostupnost:
Skladem u dodavatele
Odesíláme za 9-15 dnů
3 759
Kč
Today AI and Machine/Deep Learning have become the hottest areas in the information technology. This...
