Anomalous X-Ray Scattering for Materials Characterization

Name: Anomalous X-Ray Scattering for Materials Characterization
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783540434436
Price: 5079 CZK
Availability: InStock

Atomic-Scale Structure Determination

Autor: Yoshio Waseda

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Dostupnost: Skladem u dodavatele v malém množství

Odesíláme za 13-18 dnů

5 079 Kč

The evolution of our understanding of most properties of new functional materials is related to our...

Informace o knize

Autor

Yoshio Waseda

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2002

Stránek

214

EAN

9783540434436

ISBN

3540434437

Enbook ID

01564214

Vydavatel

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Hmotnost

1110

Rozměry

155 x 235 x 20

Kompletní popis

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scatte- ring (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.

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Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

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