Kniha Applied Scanning Probe Methods II Bharat Bhushan

Applied Scanning Probe Methods II

Scanning Probe Microscopy Techniques

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 5-8 dnů
2 457
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2010
Stránek
420
EAN
9783642065699
ISBN
3642065694
Enbook ID
01651804
Hmotnost
706
Rozměry
155 x 235 x 23

Kompletní popis

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Mohlo by vás zajímat

1 120

Fortune

Joseph Millar
291
877

What a Party!

Terry McAuliffe
476

Continence and Incontinence

El Hemaly Abdel Karim
906
694

A Merry Auction

Audrey Claire
210

Nuclear Law

Stephen Tromans
6 804

Zákaznicí kteří koupili tuto knihu koupili také

Miasteczko Mudiflof

Klaudia Opuchlik - Guaramonti
308

Tajná služba v akci

Reinhard Gehlen
131
592
501
594

Tiberius

Adolf Stahr
1 376
494

nexus

Torsten Schneider Thuadhoi
299

Heslo:Jazz Dock

Monika Petráková; Filip Čenžák
37