Assessing Fault Model and Test Quality, 1

Name: Assessing Fault Model and Test Quality, 1
Brand: Springer, Berlin
SKU: 9781461366027
Price: 2567 CZK
Availability: InStock

Autor: Kenneth M. Butler, M. Ray Mercer

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer, Berlin

Dostupnost: Skladem u dodavatele v malém množství

Odesíláme za 13-18 dnů

2 567 Kč

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital in...

Informace o knize

Autor

Kenneth M. Butler, M. Ray Mercer

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2012

Stránek

132

EAN

9781461366027

ISBN

146136602X

Enbook ID

02016398

Vydavatel

Springer, Berlin

Hmotnost

248

Rozměry

155 x 235 x 8

Kompletní popis

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Assessing Fault Model and Test Quality, 1

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také