Atomic Force Microscopy: A Concise Introduction

Name: Atomic Force Microscopy: A Concise Introduction
Brand: World Scientific Publishing Company
SKU: 9789819823093
Price: 2083 CZK
Availability: InStock

Autor: BURNHAM NANCY A

Jazyk:

Vazba: Pevná

Vydavatel: World Scientific Publishing Company

Dostupnost: Skladem u dodavatele

Odesíláme za 9-15 dnů

2 083 Kč

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fu...

Informace o knize

Autor

BURNHAM NANCY A

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2025

Stránek

250

EAN

9789819823093

ISBN

9819823099

Enbook ID

49878957

Vydavatel

World Scientific Publishing Company

Hmotnost

458

Kompletní popis

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.
Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.
Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.

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