Defect Detection via THz Imaging

Name: Defect Detection via THz Imaging
Brand: VDM Verlag
SKU: 9783639103694
Price: 1149 CZK
Availability: InStock

Potentials and Limitations

Autor: Kaveh Houshmand

Jazyk:

Vazba: Brožovaná

Vydavatel: VDM Verlag

Dostupnost: Skladem u dodavatele

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Until recent years, terahertz waves were an§undiscovered, or most importantly, an unexploited§area o...

Informace o knize

Autor

Kaveh Houshmand

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2008

Stránek

EAN

9783639103694

ISBN

3639103696

Enbook ID

06819352

Vydavatel

VDM Verlag

Hmotnost

127

Rozměry

152 x 229 x 5

Kompletní popis

Until recent years, terahertz waves were an§undiscovered, or most importantly, an unexploited§area of electromagnetic spectrum. Recent advances in§hardware have started to open up the eld to new§applications such as THz imaging. This non§destructive technology can penetrate through diverse§material such that the internal structure which is§invisible to other imaging modalities, can be§visualized. However, automated processing of THz§images can be quite challenging. Low contrast and the§presence of a widely unknown type of noise make the§analysis of these images difficult. Therefore,§pre-processing techniques are required for further§investigations.

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Defect Detection via THz Imaging

Potentials and Limitations

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také