Design for Testability, Debug and Reliability

Name: Design for Testability, Debug and Reliability
Brand: Springer Nature Switzerland AG
SKU: 9783030692087
Price: 2514 CZK
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Autor: Sebastian Huhn

Jazyk:

Vazba: Pevná

Vydavatel: Springer Nature Switzerland AG

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This book introduces several novel approaches to pave the way for the next generation of integrated...

Informace o knize

Autor

Sebastian Huhn

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2021

Stránek

188

EAN

9783030692087

ISBN

3030692086

Enbook ID

35705730

Vydavatel

Springer Nature Switzerland AG

Hmotnost

453

Rozměry

160 x 241 x 16

Kompletní popis

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

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Design for Testability, Debug and Reliability

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