Electromigration and Electronic Device Degradation

Name: Electromigration and Electronic Device Degradation
Brand: John Wiley & Sons Inc
SKU: 9780471584896
Price: 5626 CZK
Availability: InStock

Autor: Christou

Jazyk:

Vazba: Pevná

Vydavatel: John Wiley & Sons Inc

Dostupnost: Skladem u dodavatele

Odesíláme za 10-18 dnů

5 626 Kč

Electromigration is a mass transport effect in metals under high current densities, which causes the...

Informace o knize

Autor

Christou

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

1994

Stránek

344

EAN

9780471584896

ISBN

0471584894

Enbook ID

04892340

Vydavatel

John Wiley & Sons Inc

Hmotnost

656

Rozměry

164 x 239 x 25

Kompletní popis

Electromigration is a mass transport effect in metals under high current densities, which causes the metal atoms to migrate away from a high current density point and leads to the failure of integrated circuits. It is therefore an important reliability issue. This study reviews the topic for both the silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details, including an investigation of temperature dependence.

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Electromigration and Electronic Device Degradation

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