Electromigration

Name: Electromigration
Brand: VDM Verlag Dr. Mueller E.K.
SKU: 9783639088137
Price: 1149 CZK
Availability: InStock

Studied with the Optical Microscopy Imaging Method

Autor: Linghong Li

Jazyk:

Vazba: Brožovaná

Vydavatel: VDM Verlag Dr. Mueller E.K.

Dostupnost: Skladem u dodavatele

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Electromigration is a microscopic phenomenon §involving electric field-induced diffusion, which is §...

Informace o knize

Autor

Linghong Li

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2008

Stránek

EAN

9783639088137

ISBN

3639088131

Enbook ID

06817951

Vydavatel

VDM Verlag Dr. Mueller E.K.

Hmotnost

113

Rozměry

152 x 229 x 4

Kompletní popis

Electromigration is a microscopic phenomenon §involving electric field-induced diffusion, which is §very relevant to damage in interconnections. A §common method for monitoring interconnection §degradation is through electrical resistance §measurements, which requires direct electrical §contact. It is desirable to develop non-contact §methods to monitor electromigration damage §formation. In this thesis, we propose a novel §Optical Microscopy Imaging Method (OMIM), and we §provide a theoretical description and experimental §results. OMIM not only provides a new method for §studying electromigration, but also provides a §useful method for studying other micro-devices and §materials in a non- contact mode.

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Electromigration

Studied with the Optical Microscopy Imaging Method

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také