Kniha Electron Beam Testing Technology John T.L. Thong

Electron Beam Testing Technology

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 5-8 dnů
3 654
This is the first comprehensive volume on electron beam testing for integrated circuits. Including i...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2013
Stránek
462
EAN
9781489915245
ISBN
1489915249
Enbook ID
02254694
Hmotnost
905
Rozměry
178 x 254 x 26

Kompletní popis

This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.

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