Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Name: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Brand: Cambridge University Press
SKU: 9780521848756
Price: 2493 CZK
Availability: InStock

Autor: S J B Reed

Jazyk:

Vazba: Pevná

Vydavatel: Cambridge University Press

Dostupnost: Skladem u dodavatele

Odesíláme za 10-18 dnů

2 493 Kč

Originally published in 2005, this book covers the closely related techniques of electron microprobe...

Informace o knize

Autor

S J B Reed

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2005

Stránek

232

EAN

9780521848756

ISBN

052184875X

Enbook ID

04095600

Vydavatel

Cambridge University Press

Hmotnost

584

Rozměry

182 x 255 x 15

Kompletní popis

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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