Field Emission Scanning Electron Microscopy

Name: Field Emission Scanning Electron Microscopy
Brand: Springer Verlag, Singapore
SKU: 9789811044328
Price: 1602 CZK
Availability: InStock

Autor: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer Verlag, Singapore

Dostupnost: Skladem u dodavatele

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This book highlights what is now achievable in terms of materials characterization with the new gene...

Informace o knize

Autor

Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2017

Stránek

137

EAN

9789811044328

ISBN

9811044325

Enbook ID

16018571

Vydavatel

Springer Verlag, Singapore

Hmotnost

252

Rozměry

240 x 159 x 13

Kompletní popis

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

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Field Emission Scanning Electron Microscopy

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