High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

Name: High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Brand: Springer Verlag, Singapore
SKU: 9789811010729
Price: 2286 CZK
Availability: InStock

Autor: Zheng Wang, Anupam Chattopadhyay

Jazyk:

Vazba: Pevná

Vydavatel: Springer Verlag, Singapore

Dostupnost: Skladem u dodavatele

Odesíláme za 10-13 dnů

2 286 Kč

This book introduces a novel framework for accurately modeling the errors in nanoscale technology an...

Informace o knize

Autor

Zheng Wang, Anupam Chattopadhyay

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2017

Stránek

197

EAN

9789811010729

ISBN

9811010722

Enbook ID

02976144

Vydavatel

Springer Verlag, Singapore

Hmotnost

4557

Rozměry

155 x 235 x 18

Kompletní popis

This book introduces a novel framework for accurately modeling the errors in nanoscale technology and developing a smooth tool flow at high-level design abstractions to estimate error effects, which aids the development of high-level fault-tolerant techniques. In total, the book presents 6 solutions for reliability estimation (3 for fault injection and 3 for analytical estimation) and 5 techniques for reliability exploration (3 for architectural level and 2 for system-level). It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.§§

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High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

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