High-Resolution X-Ray Scattering

Name: High-Resolution X-Ray Scattering
Brand: Springer-Verlag New York Inc.
SKU: 9780387400921
Price: 3252 CZK
Availability: InStock

From Thin Films to Lateral Nanostructures

Autor: Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele v malém množství

Odesíláme za 13-18 dnů

3 252 Kč

The book presents a detailed description of high-resolution x-ray scattering methods suitable for th...

Informace o knize

Autor

Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2004

Stránek

408

EAN

9780387400921

ISBN

0387400923

Enbook ID

01382119

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

860

Rozměry

155 x 235 x 22

Kompletní popis

The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.

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High-Resolution X-Ray Scattering

From Thin Films to Lateral Nanostructures

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také