Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Name: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Brand: Springer
SKU: 9780792393061
Price: 2567 CZK
Availability: InStock

Theory and Computational Models

Autor: José Pineda de Gyvez

Jazyk:

Vazba: Pevná

Vydavatel: Springer

Dostupnost: Skladem u dodavatele v malém množství

Odesíláme za 13-18 dnů

2 567 Kč

The history of this book begins way back in 1982. At that time a research proposal was filed with th...

Informace o knize

Autor

José Pineda de Gyvez

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

1992

Stránek

167

EAN

9780792393061

ISBN

0792393066

Enbook ID

05251297

Vydavatel

Springer

Hmotnost

1000

Rozměry

155 x 235 x 13

Kompletní popis

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Theory and Computational Models

Informace o knize

Kompletní popis

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