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Kelvin Probe Force Microscopy

Autor: Sascha Sadewasser, Thilo Glatzel

Jazyk:

Vazba: Pevná

Vydavatel: Springer International Publishing AG

Dostupnost: Skladem u dodavatele

Odesíláme za 10-18 dnů

4 712 Kč

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic...

Informace o knize

Autor

Sascha Sadewasser, Thilo Glatzel

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2018

Stránek

521

EAN

9783319756868

ISBN

3319756869

Enbook ID

18836065

Vydavatel

Springer International Publishing AG

Hmotnost

986

Rozměry

242 x 167 x 38

Kompletní popis

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.