Lifetime Spectroscopy

Name: Lifetime Spectroscopy
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783540253037
Price: 6845 CZK
Availability: InStock

A Method of Defect Characterization in Silicon for Photovoltaic Applications

Autor: Stefan Rein

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Dostupnost: Skladem u dodavatele

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6 845 Kč

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analy...

Informace o knize

Autor

Stefan Rein

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2005

Stránek

492

EAN

9783540253037

ISBN

3540253033

Enbook ID

01560453

Vydavatel

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Hmotnost

950

Rozměry

241 x 166 x 37

Kompletní popis

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

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Lifetime Spectroscopy

A Method of Defect Characterization in Silicon for Photovoltaic Applications

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také