Kniha Microelectronic Reliability Edward B. Hakim

Microelectronic Reliability

Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 9-15 dnů
3 474
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
1989
Stránek
396
EAN
9780890062845
ISBN
9780890062845
Enbook ID
05357936
Hmotnost
750
Rozměry
152 x 229 x 25

Kompletní popis

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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