Kniha Microelectronic Reliability Emiliano Pollino

Microelectronic Reliability

Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 9-15 dnů
3 652
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
1989
Stránek
556
EAN
9780890063507
ISBN
9780890063507
Enbook ID
05357937
Hmotnost
982
Rozměry
152 x 229 x 34

Kompletní popis

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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