Kniha Microelectronic Test Structures for CMOS Technology Mark B Ketchen

Microelectronic Test Structures for CMOS Technology

Jazyk: Angličtina
Vazba: Brožovaná
Vydavatel: Springer, Berlin
Dostupnost: Skladem u dodavatele
Odesíláme za 5-8 dnů
2 901
Test structures are becoming more important in the development of CMOS technologies. Covering the ba...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2014
Stránek
373
EAN
9781489990556
ISBN
9781489990556
Enbook ID
09062367
Vydavatel
Hmotnost
623
Rozměry
155 x 22 x 21

Kompletní popis

Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.§

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