Modeling Nanoscale Imaging in Electron Microscopy

Name: Modeling Nanoscale Imaging in Electron Microscopy
Brand: Springer-Verlag New York Inc.
SKU: 9781461421900
Price: 2286 CZK
Availability: InStock

Autor: Thomas Vogt, Wolfgang Dahmen, Peter G. Binev

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele

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2 286 Kč

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made u...

Informace o knize

Autor

Thomas Vogt, Wolfgang Dahmen, Peter G. Binev

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2012

Stránek

182

EAN

9781461421900

ISBN

146142190X

Enbook ID

01427170

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

459

Rozměry

155 x 235 x 14

Kompletní popis

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing

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Modeling Nanoscale Imaging in Electron Microscopy

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