Kniha MOS Interface Physics, Process and Characterization Shengkai Wang

MOS Interface Physics, Process and Characterization

Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 9-15 dnů
2 991
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important compo...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2021
Stránek
162
EAN
9781032106274
ISBN
1032106271
Enbook ID
36543611
Hmotnost
390
Rozměry
235 x 157 x 17

Kompletní popis

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

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