Multi-Chip Module Test Strategies

Name: Multi-Chip Module Test Strategies
Brand: Springer-Verlag New York Inc.
SKU: 9781461377986
Price: 2689 CZK
Availability: InStock

Autor: Yervant Zorian

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: U nakladatele na objednávku

Odesíláme za 17-27 dnů

2 689 Kč

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physica...

Informace o knize

Autor

Yervant Zorian

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2012

Stránek

167

EAN

9781461377986

ISBN

9781461377986

Enbook ID

06623159

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

369

Rozměry

195 x 260 x 10

Kompletní popis

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. §Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. §Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). §

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