Kniha Nano-CMOS Gate Dielectric Engineering Hei Wong

Nano-CMOS Gate Dielectric Engineering

Autor: Hei Wong
Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 14-21 dnů
3 875
Covering the physics, materials, devices, and fabrication processes for high-k gate dielectric mater...

Informace o knize

Autor
Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2011
Stránek
248
EAN
9781439849590
ISBN
9781439849590
Enbook ID
06708163
Hmotnost
500
Rozměry
163 x 242 x 20

Kompletní popis

Covering the physics, materials, devices, and fabrication processes for high-k gate dielectric materials, this text systematically describes how the fundamental electronic structures and other material properties of the transition and rare earth metals affect the electrical properties of the dielectric films, the dielectric/silicon and the dielectric/metal gate interfaces, and the resulting device properties. Specific topics include the problems and solutions encountered with high-k material thermal stability, defect density, and poor initial interface with silicon substrate. The text also addresses the essence of thin film deposition, etching, and process integration of high-k materials in an actual CMOS process.

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