Nanometer Technology Designs

Name: Nanometer Technology Designs
Brand: Springer-Verlag New York Inc.
SKU: 9780387764863
Price: 2286 CZK
Availability: InStock

High-Quality Delay Tests

Autor: Mohammad Tehranipoor, Nisar Ahmed

Jazyk:

Vazba: Pevná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele

Odesíláme za 10-13 dnů

2 286 Kč

Adopting new fabrication technologies not only provides higher integration and enhances performance,...

Informace o knize

Autor

Mohammad Tehranipoor, Nisar Ahmed

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2007

Stránek

281

EAN

9780387764863

ISBN

0387764860

Enbook ID

01382894

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

626

Rozměry

164 x 242 x 22

Kompletní popis

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.§Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

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Nanometer Technology Designs

High-Quality Delay Tests

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také