Quantitative X-Ray Diffractometry

Name: Quantitative X-Ray Diffractometry
Brand: Springer-Verlag New York Inc.
SKU: 9781461395379
Price: 2286 CZK
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Autor: Giora Kimmel

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer-Verlag New York Inc.

Dostupnost: Skladem u dodavatele

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One of the most important techniques for determining the atomic structure of a material is X-ray dif...

Informace o knize

Autor

Giora Kimmel

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2011

Stránek

372

EAN

9781461395379

ISBN

9781461395379

Enbook ID

06624110

Vydavatel

Springer-Verlag New York Inc.

Hmotnost

681

Rozměry

170 x 244 x 22

Kompletní popis

One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.

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Quantitative X-Ray Diffractometry

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