Kniha Reflection Electron Microscopy and Spectroscopy for Surface Analysis Zhong Lin Wang

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 9-15 dnů
1 588
In this book the theories, techniques and applications of reflection electron microscopy (REM), refl...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2005
Stránek
460
EAN
9780521017954
ISBN
0521017955
Enbook ID
02017914
Hmotnost
731
Rozměry
170 x 244 x 25

Kompletní popis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

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