Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Name: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Brand: Cambridge University Press
SKU: 9780521482660
Price: 3806 CZK
Availability: InStock

Autor: Zhong Lin Wang

Jazyk:

Vazba: Pevná

Vydavatel: Cambridge University Press

Dostupnost: Skladem u dodavatele

Odesíláme za 9-15 dnů

3 806 Kč

In this book the theories, techniques and applications of reflection electron microscopy (REM), refl...

Informace o knize

Autor

Zhong Lin Wang

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

1996

Stránek

458

EAN

9780521482660

ISBN

0521482666

Enbook ID

02032669

Vydavatel

Cambridge University Press

Hmotnost

1097

Rozměry

170 x 244 x 25

Kompletní popis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Nejčastěji hledané

Categories

Authors

Publishers

Produkty

Produkty

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také