Kniha Reliability Technology for Integrated Circuit Packaging Yunfei En

Reliability Technology for Integrated Circuit Packaging

Autor: Yunfei En, Si Chen
Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 10-13 dnů
3 571
This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms,...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2026
Stránek
509
EAN
9789819538843
ISBN
981953884X
Enbook ID
49699488
Hmotnost
1010

Kompletní popis

This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms, advanced structures and reliability methods, with a focus on materials, structure and stress.

Reliability, a key indicator of product quality, spans multiple disciplines such as materials science and electronics. In China's pursuit of "high-quality development" a focus on reliability is essential to advancing manufacturing.

Written by a leading expert from the State Key Laboratory, this book is important for improving the performance of electronic products and supporting the growth of China's electronic information industry.

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