Scanning Electron Microscopy and X-Ray Microanalysis
Autor:
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
Dostupnost:
Skladem u dodavatele
Odesíláme za 8-11 dnů
2 234
Kč
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a...
