Scanning Electron Microscopy

Name: Scanning Electron Microscopy
Brand: NY RESEARCH PRESS
SKU: 9781632384065
Price: 2835 CZK
Availability: InStock

Autor: Lisa Page

Jazyk:

Vazba: Pevná

Vydavatel: NY RESEARCH PRESS

Dostupnost: 50 % šance

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Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments empl...

Informace o knize

Autor

Lisa Page

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2015

Stránek

292

EAN

9781632384065

ISBN

163238406X

Enbook ID

12434612

Vydavatel

NY RESEARCH PRESS

Hmotnost

572

Rozměry

236 x 162 x 23

Kompletní popis

Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.

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Scanning Electron Microscopy

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