Scanning Probe Microscopy in Industrial Applications - Nanomechanical Characterization
Autor:
Dalia G Yablon
Dostupnost:
Skladem u dodavatele v malém množství
Odesíláme za 11-15 dnů
3 213
Kč
Covering a diverse range of practical applications and real-world examples, Scanning Probe Microsco...