Kniha Scanning Probe Microscopy Bert Voigtlander

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 10-18 dnů
4 138
This book explains the operating principles of atomic force microscopy and scanning tunneling micros...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2016
Stránek
382
EAN
9783662505571
ISBN
3662505576
Enbook ID
15201769
Hmotnost
6029
Rozměry
155 x 235 x 22

Kompletní popis

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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