Scanning Probe Microscopy

Name: Scanning Probe Microscopy
Brand: In Tech
SKU: 9789535105763
Price: 2535 CZK
Availability: InStock

Physical Property Characterization at Nanoscale

Autor: Vijay Nalladega

Jazyk:

Vazba: Pevná

Vydavatel: In Tech

Dostupnost: Skladem u dodavatele

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2 535 Kč

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnol...

Informace o knize

Autor

Vijay Nalladega

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2012

Stránek

258

EAN

9789535105763

ISBN

9535105760

Enbook ID

24120415

Vydavatel

In Tech

Hmotnost

612

Rozměry

170 x 244 x 16

Kompletní popis

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

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Scanning Probe Microscopy

Physical Property Characterization at Nanoscale

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Kompletní popis

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