Kniha Seismic processing and imaging with diffractions Sergius Dell

Seismic processing and imaging with diffractions

Autor: Sergius Dell
Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: Skladem u dodavatele
Odesíláme za 5-8 dnů
1 376
Reflected and diffracted waves have different nature and role in the applied seismics. Diffractions...

Informace o knize

Autor
Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2012
Stránek
152
EAN
9783838133119
ISBN
3838133110
Enbook ID
06918439
Hmotnost
231
Rozměry
152 x 229 x 9

Kompletní popis

Reflected and diffracted waves have different nature and role in the applied seismics. Diffractions itself can be classified in both real seismic and hypothetical diffractions. The real seismic diffractions are seismic waves which are scattered on small heterogeneities in the subsurface or diffracted at the edges and tips, and recorded as the diffracted part of the whole wavefield. To image objects beyond the classical Rayleigh limit, it is indispensable to use real seismic diffractions.The hypothetical diffractions are mathematical constructions resulting from Huygens principle which helps to correctly image reflected events. These Huygens diffractions build a kernel of seismic reflection imaging, particularly, Kirchhoff migration. The migrated data represent pure reflected data with a higher resolution. Considering either real or Huygens diffractions allows to adjust seismic tools for particular needs depending on the interpreter's goal and the geological interpretation. The book is intended for all who want to have a look at non-conventional seismic methods.

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