Semiconductor Memory Testing

Name: Semiconductor Memory Testing
Brand: VDM Verlag Dr. Müller
SKU: 9783639194401
Price: 1173 CZK
Availability: InStock

Fault Models and Test Considerations for High Performance Embedded SRAM's

Autor: Anuj Gupta

Jazyk:

Vazba: Brožovaná

Vydavatel: VDM Verlag Dr. Müller

Dostupnost: U nakladatele na objednávku

Odesíláme za 17-27 dnů

1 173 Kč

Stringent test quality requirements, at-speed test limitations & total cost associated with using ex...

Informace o knize

Autor

Anuj Gupta

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2009

Stránek

EAN

9783639194401

Enbook ID

06827526

Vydavatel

VDM Verlag Dr. Müller

Hmotnost

114

Rozměry

151 x 4 x 10

Kompletní popis

Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.

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Semiconductor Memory Testing

Fault Models and Test Considerations for High Performance Embedded SRAM's

Informace o knize

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