Kniha Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed

Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Jazyk: Angličtina
Vazba: Brožovaná
Dostupnost: U nakladatele na objednávku
Odesíláme za 17-27 dnů
1 174
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Brožovaná
Vydáno
2012
Stránek
72
EAN
9783848400355
Enbook ID
07085730
Hmotnost
118
Rozměry
152 x 229 x 4

Kompletní popis

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

Mohlo by vás zajímat

810
211

News

Alain de Botton
241

Biblioth Que Publique de Gen Ve

Bi Publique Et Universitaire De Gen Ve
263

Old Soldier's Memories

S. H. Jones-Parry
1 097
822

Zákaznicí kteří koupili tuto knihu koupili také

167

Ashford Park

Lauren Willig
295