Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

Name: Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Brand: World Scientific Publishing Co Pte Ltd
SKU: 9789812778819
Price: 3593 CZK
Availability: InStock

Autor: Takashi Nakamura, Mamoru Baba, Eishi Ibe

Jazyk:

Vazba: Pevná

Vydavatel: World Scientific Publishing Co Pte Ltd

Dostupnost: 50 % šance

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Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concer...

Informace o knize

Autor

Takashi Nakamura, Mamoru Baba, Eishi Ibe

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2008

Stránek

368

EAN

9789812778819

ISBN

9812778810

Enbook ID

05068958

Vydavatel

World Scientific Publishing Co Pte Ltd

Hmotnost

654

Rozměry

162 x 237 x 20

Kompletní popis

Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

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Kompletní popis

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