Kniha Testing Static Random Access Memories Said Hamdioui

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Autor: Said Hamdioui
Jazyk: Angličtina
Vazba: Pevná
Dostupnost: Skladem u dodavatele
Odesíláme za 10-13 dnů
2 286
"Testing Static Random Access Memories" covers testing of one of the important semiconductor memorie...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2004
Stránek
221
EAN
9781402077524
ISBN
1402077521
Enbook ID
01418168
Hmotnost
1150
Rozměry
155 x 235 x 18

Kompletní popis

"Testing Static Random Access Memories" covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

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