Testing Static Random Access Memories

Name: Testing Static Random Access Memories
Brand: Springer, Berlin
SKU: 9781441954305
Price: 2286 CZK
Availability: InStock

Defects, Fault Models and Test Patterns

Autor: Said Hamdioui

Jazyk:

Vazba: Brožovaná

Vydavatel: Springer, Berlin

Dostupnost: Skladem u dodavatele

Odesíláme za 5-8 dnů

2 286 Kč

Testing Static Random Access Memories covers testing of one of the important semiconductor memories...

Informace o knize

Autor

Said Hamdioui

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2010

Stránek

221

EAN

9781441954305

ISBN

1441954309

Enbook ID

01423708

Vydavatel

Springer, Berlin

Hmotnost

379

Rozměry

160 x 240 x 13

Kompletní popis

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

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Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Informace o knize

Kompletní popis

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