Transmission Electron Microscopy

Name: Transmission Electron Microscopy
Brand: Springer International Publishing AG
SKU: 9783319266497
Price: 2906 CZK
Availability: InStock

Diffraction, Imaging, and Spectrometry

Autor: C. Barry Carter, David B. Williams

Jazyk:

Vazba: Pevná

Vydavatel: Springer International Publishing AG

Dostupnost: U nakladatele na objednávku

Odesíláme za 17-27 dnů

2 906 Kč

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Scienc...

Informace o knize

Autor

C. Barry Carter, David B. Williams

Jazyk

Angličtina

Vazba

Kniha - Pevná

Vydáno

2016

Stránek

518

EAN

9783319266497

ISBN

3319266497

Enbook ID

09931565

Vydavatel

Springer International Publishing AG

Hmotnost

1466

Rozměry

217 x 288 x 27

Kompletní popis

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science.§§Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.§§

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Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

Informace o knize

Kompletní popis

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Zákaznicí kteří koupili tuto knihu koupili také