Kniha VLSI Test Principles and Architectures Laung-Terng Wang

VLSI Test Principles and Architectures

Jazyk: Angličtina
Vazba: Pevná
Dostupnost: 50 % šance
Prohledáme celý svět
1 806
This book is a comprehensive guide to new DFT methods that will show the readers how to design a tes...

Informace o knize

Jazyk
Angličtina
Vazba
Kniha - Pevná
Vydáno
2006
Stránek
808
EAN
9780123705976
ISBN
0123705975
Enbook ID
02703621
Hmotnost
1806
Rozměry
200 x 241 x 51

Kompletní popis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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