One Sample Location Test for Symmetrical

Name: One Sample Location Test for Symmetrical
Brand: VDM Verlag Dr. Müller
SKU: 9783639207170
Price: 1407 CZK
Availability: InStock

Non-Normal Situations

Autor: A. S. M. Borhan

Jazyk:

Vazba: Brožovaná

Vydavatel: VDM Verlag Dr. Müller

Dostupnost: U nakladatele na objednávku

Odesíláme za 17-27 dnů

1 407 Kč

This book first studies the performance of one sample t-test,z-test and Wilcoxon test under normal a...

Informace o knize

Autor

A. S. M. Borhan

Jazyk

Angličtina

Vazba

Kniha - Brožovaná

Vydáno

2009

Stránek

144

EAN

9783639207170

Enbook ID

06828682

Vydavatel

VDM Verlag Dr. Müller

Hmotnost

231

Rozměry

150 x 220 x 9

Kompletní popis

This book first studies the performance of one sample t-test,z-test and Wilcoxon test under normal and non-normal situation for location problem.The simulation results show that power functions of t-test and z-test are very much affected when the data are generated from non-normal population.Also the Wilcoxon test produces lower power than t-test and z-test for small sample sizes even in non-normal situation.To overcome the dependence on normality assumption Carolan and Rayner derived Score test and Wald test for one sample location problem under symmetric condition,where the gk(x;µ, ) family of distribution was used to produce non-normal data for simulation.For the purpose of more robust procedure this book also suggests a robust test procedure for one sample location problem under a gk(x;µ, ) distribution assumption.The procedure is based on the ratio of the restricted and unrestricted likelihood of the sample data calculated numerically,and hence named as numerical likelihood ratio test(NLRT).The powers computed suggest that the NLRT is a better alternative to all of the tests considered in this book.

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One Sample Location Test for Symmetrical

Non-Normal Situations

Informace o knize

Kompletní popis

Mohlo by vás zajímat

Zákaznicí kteří koupili tuto knihu koupili také